The transmission electron microscope (TEM) is a powerful tool. It lets scientists see tiny details in materials. But sometimes, it's hard to spot certain types of damage. This is where a clever trick comes in. It's called low-frequency band-pass Fourier filtering. It helps to highlight damage that's not easy to see.

This method focuses on small changes in brightness in TEM images. These changes can show where damage has happened. For example, it can reveal tiny holes caused by helium ions hitting iron. The best part? It doesn't need any fancy equipment. Basic TEM imaging and simple software are enough.

One big advantage is that it needs little defocus. This means the images stay sharp. Plus, it can block out unwanted details. This makes the damage easier to see. But here's a catch: the results depend on the filtering settings. So, scientists need to be careful.

Compared to regular imaging, this technique gives a clearer picture. It shows the size, number, and spread of the damage. This can help scientists understand how materials behave under stress. It's a simple yet effective way to see the unseen.

But why is this important? Well, understanding damage in materials is crucial. It helps in making better materials for various uses. From building bridges to making computers, this knowledge can lead to stronger and more reliable products. So, this trick with TEM is more than just a cool technique. It's a step towards better technology.

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